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The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.
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The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.
ukryj opis- Wydawnictwo: Springer International Publishing AG
- Kod:
- Rok wydania: 2018
- Język: Angielski
- Oprawa: Twarda
- Liczba stron: 159
- Szerokość opakowania: 24.1 cm
- Wysokość opakowania: 16.6 cm
- Głębokość opakowania: 1.2 cm
- Waga: 434 g
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